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MacDonald, A., Zick, J., Netoff, T., & Chafee, M. (2016-11-18). The Computation of Collapse: Can Reliability Engineering Shed Light on Mental Illness?. In Computational Psychiatry: New Perspectives on Mental Illness. : The MIT Press. Retrieved 18 Jan. 2022, from https://mitpress.universitypressscholarship.com/view/10.7551/mitpress/9780262035422.001.0001/upso-9780262035422-chapter-009.